Reliability Test Plan Based on Logistic-Exponential Distribution and Its Application

In this article, a reliability test plan is developed for Logistic-exponential distribution (LoED) under time truncated life scheme. The has been chosen because it can used to model lifetime of several phenomenon and performs better than many well known existing distributions. With the discussions statistical properties aforesaid model, established assumption median quality characteristics when minimum confidence level P* given. To quench objective paper i.e; serve as guiding aid emerging practitioners, sample sizes have obtained by using binomial approximation Poisson proposed plan. Further, operating characteristic (OC) values various choices are placed. Also, ratio true specified presented producer’s risk. Important findings given considered value k=0.75,1,2. demonstrate appropriateness suggested achieved four real situation.